氩离子抛光—场发射扫描电镜分析方法在识别有机显微组分中的应用

Ar-ion polishing FE-SEM analysis of organic maceral identification

  • 摘要: 氩离子抛光—场发射扫描电镜是页岩储层微观孔隙结构表征的常用手段,但单独依靠扫描电镜观察无法直接识别有机质类型,而荧光显微镜是鉴定显微组分的主要方法。通过大量场发射扫描电镜与荧光显微镜相结合的定位观察技术,实现对扫描电镜下特定显微组分的鉴定和观察,并总结出扫描电镜下有机显微组分鉴定的方法和特征。氩离子抛光—场发射扫描电镜下,可通过有机质的外部形态、硬度、亮度、颜色、突起、有机质孔隙发育特征以及裂隙发育特征等综合判断出结构镜质体、无结构镜质体、镜屑体、丝质体、半丝质体、菌类分泌体、惰屑体、油沥青以及焦沥青。

     

    Abstract: Argon-ion polishing field emission-scanning electron microscopy (FE-SEM) is a common method to characterize the microscopic pore structure characteristics of shale reservoirs, but organic macerals cannot be directly identified by FE-SEM alone. Fluorescence microscopy is the main method for identifying macerals. Through a large number of localized FE-SEM and fluorescence microscopy observations, the microscopic characteristics of specific macerals under FE-SEM were summarized. The macerals visualized using FE-SEM can be interpreted based on features such as the external shape, hardness, brightness, color, relief, organic pore development characteristics and fissure development characteristics of the organic matter. Telinite, collotelinite, vitrodetrinite, fusinite, semifusinite, funginite, inertodetrinite, oil bitumen and pyrobitumen were identified.

     

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